AI News, ISO/IEC JTC 1/SC 42 artificial intelligence

Standards and Artificial Intelligence

Wael William Diab, Chair of ISO/IEC JTC 1/SC 42, explains Artificial Intelligence and the role of International Standards in the implementation of this technology.

Standards and Artificial Intelligence Continued

Wael William Diab, Chair of ISO/IEC JTC 1/SC 42, explains Artificial Intelligence and eases the minds of concerned consumers.

Mandatory RFID By End of Month !!

UPDATE : They Have Moved the Date to to Oct 1 2017. Maybe We Made A difference !!! Its Here !!!Cash on the way out "Radio-frequency identification (RFID) ...

TDynamic Scene Deblurring Techniques. Prof. Kyoung Mu Lee

Keynote TDynamic Scene Deblurring Techniques Prof. Kyoung Mu Lee Seoul National University Korea.