AI News, ISO/IEC JTC 1/SC 42 artificial intelligence
- On Wednesday, May 27, 2020
Standards and Artificial Intelligence
Wael William Diab, Chair of ISO/IEC JTC 1/SC 42, explains Artificial Intelligence and the role of International Standards in the implementation of this technology.
Standards and Artificial Intelligence Continued
Wael William Diab, Chair of ISO/IEC JTC 1/SC 42, explains Artificial Intelligence and eases the minds of concerned consumers.
Mandatory RFID By End of Month !!
UPDATE : They Have Moved the Date to to Oct 1 2017. Maybe We Made A difference !!! Its Here !!!Cash on the way out "Radio-frequency identification (RFID) ...
TDynamic Scene Deblurring Techniques. Prof. Kyoung Mu Lee
Keynote TDynamic Scene Deblurring Techniques Prof. Kyoung Mu Lee Seoul National University Korea.